All questions
AP Physics 2
14.9 Thin-Film Interference
AdvancedMCQMathematicalProportional AnalysisConceptual20.6k
Thin-film reflection setups for Configuration X and Configuration Y.
Thin-film reflection setups for Configuration X and Configuration Y.
A thin film of refractive index \(n_1\) is deposited on a thick substrate of refractive index \(n_2\). Monochromatic laser light of wavelength \(\lambda_0\) in air (\(n_{\text{air}} = 1.0\)) is normally incident on the film. In Configuration X, the refractive indices satisfy \(n_1 > n_2 > 1.0\), while in Configuration Y, they satisfy \(1.0 < n_1 < n_2\). If \(t_{\text{X}}\) and \(t_{\text{Y}}\) are the minimum non-zero film thicknesses required for maximum constructive interference of the reflected light in Configurations X and Y, respectively, what is the ratio \(\dfrac{t_{\text{X}}}{t_{\text{Y}}}\)?

Log In to Continue

Accounts are free! Log in to try this question, see explanations, save progress, and more!

Tools for a 5